| Patent Title | Name of Applicant(s) | Patent No. | Award Date | Agency/Country | Status |
|---|---|---|---|---|---|
| Heterodyne scanning probe microscopy method and scanning probe microscopy system | S. R. S. Rajadurai, D. Piras, K. Hatakeyama, P. van Neer, M. van Es, H. Sadeghian Marnani and M. van der Lans | PCT/NL20 20/050329, WO 2020/23600 2 A1 | First filed May 2019. Published Nov. 2020 | EU/ International Patent | Publis hed. |
| Method and system for imaging structures below the surface of a sample | D. Piras, B. Quesson, P. van Neer, M. van Es, L. Fillinger, K. Hatakeyama, and S. R. S. Rajadurai | PCT/NL20 20/050325, WO 2020/23599 8 A1 | First filed May 2019 Published Nov. 2020 | EU/ Interna tional Patent | Publis hed |
| Probe for high speed atomic force microscopy | G. R. Jayanth and R. Sriramshankar | 201841019 216 | First filed Aug. 2018. Published July 2020. | India | Publis hed |
| Multiple motion measurement | G. R. Jayanth, Piyush Pandey, R. Sriramshankar, and R. Sri Muthu Mrinalini | 2017/CHE/ 2015 | First filed April 2015. Published Nov. 2020 | India | Publis hed |
